- NewTom
      - 3G
      - VG
      - FP
- Mikroct (Skyscan)
      - Biomedikal
      - Material
      - Elektronik
      - Jeolojik (Elmas)
      - Yün, Kağıt
- Yazılım
      - Maxilim
      - NIP
- Panoramik (Art Plus)
- Monitor (Barco Monitor)
- Model Klavuz

 

 

SkyScan1172 (high-resolution micro-CT)

The SkyScan 1172 represents a new generation in x-ray micro-CT systems. A novel architecture in which the sample stage and the x-ray camera can both move during magnification adjustment, allows an unprecedented combination of spatial resolution, image quality, sample size accommodation and scanning speed.

The innovative flexible geometry of the SkyScan 1172 scanner is particularly advantageous over intermediate resolution levels, where scans are several times faster (to obtain the same or better image quality) compared to micro-CT systems with a fixed source-detector design. The new large format cooled x-ray digital camera achieves high spatial resolution without compromising sample size. Fast scan and reconstruction throughput is supported by a computer cluster option, which reconstructs scan datasets in less time than the scan duration in most cases, using several PCs in parallel. Cross section images are generated in a wide range of formats up to 8k x 8k pixels. The full range of SkyScan software for 2D / 3D quantitative analysis and for realistic 3D visualization supplied with all scanners.

 

Application examples:

  • Biomedikal
  • Material
  • Elektronik
  • Jeolojik
  • Yün, Kağıt

 

SPECIFICATIONS:

X-ray source : 20-100kV,10W,<5µm spot size or 20-80kV,
8W, <8µm spot size
X-ray detector : 12-bit cooled X-ray camera
CCD fiber-optically coupled to scintillator
Maximum object size : 68mm, 50mm or 37mm dependent on
X-ray camera
Detail detectability : <1µm for 68/50mm FOV systems
<2µm for 37mm FOV systems
Reconstruction : single PC or cluster volumetric reconstruction
(Feldkamp algorithm)
Optional stages : micropositioning, cooling
compression / extension / torsion (more>)
Radiation safety : <1µSv / h at any point on the instrument surface

 

 
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